Modular Research AFM Corvus

Specifications:

• Scan area: 60x60x15 μm
  

• Scanner Type: XYZ stage
  
• Resonant frequency XY - 1 kHz
• Resonant frequency Z - 30 kHz
  
• Nonlinearity  <0.1%
  
• Availability of optical interference sensors
  
• Range of manual sample positioning: 5х5mm
  
• The accuracy of manual sample positioning: 5 um
  
• AFM spatial resolution (XY, lateral) <0.1 nm
  
• AFM spatial resolution (Z, vertical)         <0.01 nm

Over 30 SPM modes realized: 

• Contact modes: measurement of normal forces, lateral forces, topography (feedback error), force curves
  
• Tapping modes: non-contact and semi-contact methods, topography (feedback error)
  
• Phase contrast
  
• Jumping Mode
  
• measurement of surface potentials
  
• Scanning Kelvin probe
  
• Spreading resistance
  
• Magnetic and electrical force microscopy